|Brand/Model: Hitachi H-7000 and CCD AMT XR-41 camera
Year of purchase: 2010
Laboratory: electronic microscopy 0C38
Brand/Model: JEOL JEM 200 CX
Year of purchase: 1991
Laboratory: electronic microscopy 0C32-0C33
|Description: transmission electron microscopy is a technique in which a beam of electrons is transmitted through an ultra-thin specimen (< 0.1 micron) and high resolution images (1.92 Å) may be obtained.
It finds application in materials science for the morphological study and the characterization of microphases, interfaces, powders and also in the field of biology.
Brightfield: morphology of the samples as image contrast;
Darkfield: micro and nano crystals present in the samples as phase contrast.
It is possible to determine the average size of the particles in systems nano sized and the size distribution.